TIA Standards developed by committee JC-13

EIA-623 - Procurement Quality of Solid State Components by Government Contractors
JEP109-C - General Requirements for Distributors of Military Semiconductor Devices
JEP112 - Test Method for Qualification and Acceptance of Circuit Support Film for Use in Microelectronic Applications
JEP114 - Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training and Certification
JEP121 - Guidelines for MIL-STD-883 Screening and QCI Optimization
JEP132 - Process Characterization Guideline
JESD16-A - Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM)
JESD26-A - General Specification for Plastic Encapsulated Microcircuits for Use in Rugged Applications
JESD27 - Ceramic Package Specification for Microelectronic Packages
JESD49 - Procurement Standard for Known Good Die (KGD)