TIA Standards developed by committee JC-14.03

EIA-659 - Failure-Mechanism-Driven Reliability Monitoring (ANSI/EIA-659-96) (Supersedes JESD29-A)
JEP131 - Process Failure Mode and Effects Analysis (FMEA)
JESD22-A117 - Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Test
JESD31 - General Requirements for Distributors of Commercial Semiconductor Devices
JESD34 - Failure-Mechanism-Driven Reliability Qualification of Silicon Devices
JESD47 - Stress-Test-Driven Qualification of Integrated Circuits
JESD50 - Special Requirements for Maverick Product Elimination
JESD62 - Outlier Identification and Management System for Electronic Components
JESD659-A - Failure-Mechanism-Driven Reliability Monitoring
JESD69 - Information Requirements for the Qualification of Silicon Devices
JESD74 - Early Life Failure Rate Calculation Procedure for Electronic Components