TIA Standards developed by committee JC-15

JEP123 - Guideline for Measurement of Electronic Package Inductance and Capacitance Model Parameters
JESD51 - Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device)
JESD51-1 - Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
JESD51-2 - Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)