TIA Standards - Passive Components

CB11 - Guidelines for the Surface Mounting of Multilayer Ceramic Chip Capacitors
CB12 - Gold Plating Study Test Report
CB13 - X-Ray Fluorescence for Measuring Plating Thickness
CB14 - Contact Lubricants
CB16 - Integrated Passive Device (IPD) Definitions
CB2 - Contamination of Printed Wiring Boards
CB3-B - Specifications and Standards Associated with Solders and Soldering
CB4 - Effect of the Wire Diameter on Wirewound Resistor Reliability
CB5 - Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
CB5-1 - Addendum to Bulletin CB5
CB6-A - Guide for the Use of Quartz Crystal Units for Frequency Control
CB8 - List of Approval Agencies, U.S. and Other Countries, Impacting Electronic Components and Equipment
EIA/IS-34 - Leaded Surface Mount Resistor Networks, Fixed Film
EIA/IS-35 - Two-Pin Dual In-Line Capacitors
EIA/IS-36 - Chip Capacitors, Multi-Layer (Ceramic Dielectric)
EIA/IS-37 - Multiple Layer High Voltage Capacitors (Radial Lead Chip Capacitors)
EIA/IS-38 - Radial Lead Capacitors (Conformally Coated)
EIA/IS-39 - Ceramic Dielectric Axial Capacitors (Glass Encapsulated)
EIA/IS-43 - Omnibus Specification-Local Network Twisted Pair Data Communications Cable
EIA/IS-43 Series - Cable for LAN Twisted Pair Data Communications
EIA/IS-43AA - Cable for LAN Twisted Pair Data Communications-Detail Specification for Type 1, Outdoor Cable
EIA/IS-43AB - Cable for LAN Twisted Pair Data Communications-Detail Specification for Type 1, Non-Plenum Cable
EIA/IS-43AC - Cable for LAN Twisted Pair Data Communications-Detail Specification for Type 1, Riser Cable
EIA/IS-43AD - Cable for LAN Twisted Pair Data Communications-Detail Specification for Type 1, Plenum Cable
EIA/IS-43AE - Cable for LAN Twisted Pair Data Communications-Detail Specification for Type 2, Non-Plenum Cable
EIA/IS-43AF - Cable for LAN Twisted Pair Data Communications-Detail Specification for Type 2, Plenum Cable
EIA/IS-43AG - Cable for LAN Twisted Pair Data Communications-Detail Specification for Type 6, Office Cable
EIA/IS-43AH - Cable for LAN Twisted Pair Data Communications-Detail Specification for Type 8, Undercarpet Cable
EIA/IS-43AJ - Cable for LAN Twisted Pair Data Communications-Detail Specification for Type 9, Plenum Cable
EIA/IS-46 - Test Procedure for Resistance to Soldering (Vapor Phase Technique) for Surface Mount Devices
EIA/IS-47 - Contact Termination Finish Standard for Surface Mount Devices
EIA/IS-48 - Axial Lead Fixed Radio Frequency (RF) Coils
EIA/IS-535BAAE - Detail Specification for Low ESR Molded Tantalum Chip
EIA/IS-692 - Ceramic Capacitor Qualification Specification
EIA/IS-701 - Production Ball Grid Array (BGA) Socket Test Specification
EIA/IS-703 - General Resistor Stress Test Qualification Specification
EIA/IS-717 - Surface Mount Tantalum Capacitor Qualification Specification
EIA/IS-722 - Low Voltage Supplemental Fuse Qualification Specification (May 1997)
EIA/IS-749 - Rectified Mains Application Expected Wear-Out Lifetime Test
EIA/IS-753 - Two-Part High Density Blade and Backplane Tuning Fork Connector
EIA/IS-757 - Visual and Mechanical Inspection for Molded SMT Solid Tantalum Capacitors
EIA/IS-759 - Multilayer Chip Inductor Qualification Specification
EIA/IS-760 - Surface Mount Wirewound Inductor Qualification Specification
EIA/IS-84 - Interim Detail Specification for 2.5 Millimeter, Two-Part Connector for Use with Printed Boards and Backplanes
EIA-153-B - Molded and Dipped Mica Capacitors (Wire Lead Styles) (ANSI/EIA-153-B-72) (R78) (R83)
EIA-155-B - Fixed Wirewound Power Resistors (ANSI/EIA-155-B-172-76) (R81) (R88)
EIA-161 - Unit Standards for Ceramic-Based Printed Circuits (ANSI/EIA-161-72) (R77) (R83)
EIA-162 - Test Standard for Ceramic-Based Printed Circuits (ANSI/EIA-162-72) (R77) (R83)
EIA-172-B - Fixed Composition Resistors (ANSI/EIA-172-B-74) (R80) (R88)
EIA-174 - Audio Transformers for Electronic Equipment
EIA-175 - Audio Inductors
EIA-176 - Pulse Transformers for Radar Equipment
EIA-179 - Classification of Tube Testers
EIA-180 - Power Transformers for Electronic Equipment
EIA-181 - Iron Core Charging Inductors
EIA-183 - Output Transformers for Radio Broadcast Receivers
EIA-186 Series - Standard Test Methods for Passive Electronic Component Parts General Instructions and Index of Tests
EIA-186-10E - Method 10: Effect of Soldering
EIA-186-11E - Method 11: Thermal Shock in Air
EIA-186-12E - Method 12: Heat-Life
EIA-186-13E - Method 13: Insulation Resistance Test
EIA-186-14E - Method 14: Panel Seal Test
EIA-186-1E - Method 1: Humidity (Steady-State)
EIA-186-2E - Method 2: Moisture Resistance (Cycling)
EIA-186-3E - Method 3: Humidity (Steady-State Sealed Container)
EIA-186-4E - Method 4: Dielectric Test (Withstanding Voltage)
EIA-186-5E - Method 5: Salt Spray (Corrosion)
EIA-186-6E - Method 6: Mechanical Robustness of Terminals
EIA-186-7E - Method 7: Vibration Fatigue Test (Low Frequency, 10 to 55 Hz)
EIA-186-8E - Method 8: Vibration, High Frequency
EIA-186-9E - Method 9: Solderability
EIA-186-E - Standard Test Methods for Passive Electronic Component Parts: General Instructions and Index of Tests (ANSI/EIA-186-E-78) (R83)
EIA-192-A - Holder Outlines and Pin Connections for Quartz Crystal Units (ANSI/EIA-192-A-69) (R75) (R81)
EIA-197-A - Power Filter Inductors for Electronic Equipment (ANSI/EIA-197-A-73) (R79) (R86)
EIA-198-1-E - Ceramic Dielectric Capacitors Classes I, II, III, and IV - Part I: Characteristics and Requirements (ANSI/EIA-198-1-E-97)
EIA-198-2-E - Ceramic Dielectric Capacitors Classes I, II, III, and IV - Part II: Test Methods (ANSI/EIA-198-2-E-97)
EIA-198-3-E - Ceramic Dielectric Capacitors Classes I, II, III, and IV - Part III: Individual Specifications (ANSI/EIA-198-3-E-98)
EIA-198-E - Ceramic Dielectric Capacitors Classes I, II, III, and IV (ANSI/EIA-198-E-91) (R97) EIA-198-1-E, Part I: Characteristics and Requirements EIA-198-1-E, Part II: Test Methods EIA-198-1-E, Part III: Individual Specifications
EIA-199-A - Solid and Semi-Solid Dielectric Transmission Lines (ANSI/EIA-199-A-72) (R78) (R83)
EIA-208 - Definition and Register, Printed Wiring (ANSI/EIA-208-72) (R77)
EIA-213 - Test Point Locations for Printed Wiring Assemblies (ANSI/EIA-213-72) (R77) (R83)
EIA-214 - Method for Calculation of Current Ratings on Hook-Up Wire
EIA-215 - Basic Requirements for Broadcast Microphone Cables
EIA-216 - Standard Method of Test for Adhesion of Printed Wiring (ANSI/EIA-216-72) (R77) (R83)
EIA-217-A - Wound Cut Cores (ANSI/EIA-217-A-72) (R78) (R83)
EIA-229-A - Fixed, Wirewound, Precision Resistors (ANSI/EIA-229-A-68) (R79)
EIA-242 - Definitions for Electromagnetic Delay Lines (ANSI/EIA-242-72) (R78) (R86)
EIA-251-A - Test to Determine the Temperature as a Function of Current in Printed Conductors (ANSI/EIA-251-A-71) (R83)
EIA-260 - Tape-Wound Toroidal Cores (ANSI/EIA-260-72) (R78) (R83)
EIA-270 - Tools, Crimping, Solderless Wiring Devices, Recommended Procedures for User Certification (ANSI/EIA-270-73) (R79)
EIA-280-C - Solderless Wrapped Electrical Connections (ANSI/EIA-280-C-92)
EIA-293 - Sonic Wire Delay Lines
EIA-297-A - Cable Connectors for Audio Facilities for Radio Broadcasting
EIA-310-D - Cabinets, Racks, Panels, and Associated Equipment (ANSI/EIA/310-D-92)
EIA-314 - Envelope and Mounting Dimensions for Encapsulated Transformers and Inductors (Using Cores Listed in Table 1 of EIA-217-A)
EIA-322 - Wirewound Power-Type Rheostats (ANSI/EIA-322-68) (R73) (R79) (R86) (R88)
EIA-327-A - Solvent Resistance of Applied Marking Materials (ANSI/EIA-327-A-76) (R81)
EIA-331 - Polarization of Stereophonic Headphones with 3-Contact Plugs
EIA-337 - General Specification for Glass Coated Thermistor Beads and Thermistor Beads in Glass Probes and Glass Rods (Negative Temperature Coefficient) (ANSI/EIA-337-67) (R77) (R81)
EIA-339 - Recommended Test Method, Layer-to-Layer Adhesion of Magnetic Tape (ANSI/EIA-339-68) (R75)
EIA-348 - Magnetic Field Polarity, Including Definitions and Determination of Polarity
EIA-356 - Standard on Definitions and Terminology in Connection with Record Changers and Manual Phonographs
EIA-364 Series - Note: All connector test procedures published in EIA-364 and its Addenda have been revised and are listed separately by Test Procedure Number and an alphabetical revision letter designation.
EIA-364-01B - TP-01B Acceleration Test Procedure for Electrical Connectors (ANSI/EIA-364-01B-00)
EIA-364-02C - TP-02C Air Leakage Test Procedure for Electrical Connectors (ANSI/EIA-364-02C-99)
EIA-364-03B - TP-03B Altitude Immersion Test Procedure for Electrical Connectors (ANSI/EIA-364-03B-99)
EIA-364-04 - TP-04 Normal Force Test Procedure for Electrical Connectors (ANSI/EIA-364-04-88)
EIA-364-05B - TP-05B, Contact Insertion, Release and Removal Force Test Procedure for Electrical Connectors (ANSI/EIA-364-05B-98)
EIA-364-06A - TP-06A Contact Resistance Test Procedure for Electrical Connectors (ANSI/EIA-364-06A-83) (R90)
EIA-364-06B - TP-06B Contact Resistance Test Procedure for Electrical Connectors (ANSI/EIA-364-06B-00)
EIA-364-07B - TP-7B, Contact Axial Concentricity Test Procedure for Electrical Connectors (ANSI/EIA-364-07B-98)
EIA-364-08B - TP-08B, Crimp Tensile Strength Test Procedure for Electrical Connectors (ANSI/EIA-364-08B-98)
EIA-364-09C - TP-09C Durability Test Procedure for Electrical Connectors and Contacts (ANSI/EIA-364-09C-99)
EIA-364-10 - TP-10 Fluid Immersion Test Procedure for Electrical Connectors (ANSI/EIA-364-10-89)
EIA-364-100 - TP-100 Marking Permanence Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-100-99)
EIA-364-101 - TP-101 Attenuation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems (ANSI/EIA-364-101-00)
EIA-364-102 - TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems (ANSI/EIA-364-102-98)
EIA-364-103 - TP-103 Propagation Delay Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems (ANSI/EIA-364-103-98)
EIA-364-104 - TP-104 Flammability Test Procedure for Electrical Connectors (ANSI/EIA-364-104-99)
EIA-364-105 - TP-105 Altitude - Low Temperature Test Procedure for Electrical Connectors (ANSI/EIA-364-105-99)
EIA-364-106 - TP-106 Standing Wave Ratio (SWR) Test Procedure for Electrical Connectors (ANSI/EIA-364-106-00)
EIA-364-107 - TP-107 Eye Pattern and Jitter Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems (ANSI/EIA-364-107-00)
EIA-364-11A - TP-11A Resistance to Solvents Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-11A-99)
EIA-364-12 - TP-12 Restricted Entry Test Procedure for Electrical Contacts for Electrical Connectors (ANSI/EIA-364-12-88)
EIA-364-13B - TP-13B Mating and Unmating Forces Test Procedure for Electrical Connectors (ANSI/EIA-364-13B-98)
EIA-364-14B - TP-14B Ozone Exposure Test Procedure for Electrical Connectors (ANSI/EIA-364-14B-99)
EIA-364-15 - TP-15 Contact Strength Test Procedure for Electrical Connectors (ANSI/EIA-364-15A-84)
EIA-364-16 - TP-16 Stripping Force Test Procedure for Solderless Wrapped Electrical Connectors (ANSI/EIA-364-16-88)
EIA-364-17B - TP-17B Temperature Life with or without Electrical Load Test Procedure for Electrical Connectors (ANSI/EIA-364-17B-99)
EIA-364-18A - TP-18A Visual and Dimensional Inspection Procedure for Electrical Connectors (ANSI/EIA-364-18A)
EIA-364-19 - TP-19 Connectors, Electrical, Torsional Insert Retention (ANSI/EIA-364-19-88)
EIA-364-20B - TP-20B Withstanding Voltage Test Procedure for Electrical Connectors, Sockets and Coaxial Contacts (ANSI/EIA-364-20B-99
EIA-364-21B - TP-21B, Insulation Resistance Test Procedure for Electrical Connectors (ANSI/EIA-364-21B-95)
EIA-364-21C - TP-21C Insulation Resistance Test Procedure for Electrical Connectors, Sockets, and Coaxial Contacts (ANSI/EIA-364-21C-00)
EIA-364-22B - TP-22B Simulated Life Test Procedure for Electrical Connectors
EIA-364-23A - TP-23A Low Level Contact Resistance Test Procedure for Electrical Connectors (ANSI/EIA-364-23A-85)
EIA-364-24B - TP-24B Maintenance Aging Test Procedure for Electrical Connectors (ANSI/EIA-364-24B-98)
EIA-364-25C - TP-25C Probe Damage Test Procedure for Electrical Connectors (ANSI/EIA-364-25C-98)
EIA-364-26B - TP-26B Salt Spray Test Procedure for Electrical Connectors, Contacts and Sockets (ANSI/EIA-364-26B-99))
EIA-364-27B - TP-27B, Mechanical Shock (Specified Pulse) Test Procedure for Electrical Connectors (ANSI/EIA-364-27B-1996)
EIA-364-28D - TP-28D, Vibration Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-28D-99)
EIA-364-29B - TP-29B Contact Retention Test Procedure for Electrical Connectors (ANSI/EIA-364-29B-98)
EIA-364-30 - TP-30 Capacitance Test Procedure for Electrical Connectors (ANSI/EIA-364-30-87)
EIA-364-31A - TP-31A Humidity Test Procedure for Electrical Connectors (ANSI/EIA-364-31A-83) (R90)
EIA-364-31B - TP-31B Humidity Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-31B-00)
EIA-364-32B - TP-32B Thermal Shock Test Procedure for Electrical Connectors (ANSI/EIA-364-32B-92)
EIA-364-32C - TP-32C Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-32C-00)
EIA-364-33 - TP-33 Inductance of Electrical Connectors (ANSI/EIA-364-33-90)
EIA-364-35B - TP-35B Insert Retention Test Procedure for Electrical Connectors (ANSI/EIA-364-35B-98)
EIA-364-36A - TP-36A, Test Procedure for Determination of Gas-Tight Characteristics for Electrical Connectors, Sockets and/or Contact Systems (ANSI/EIA-364-36A-1996)
EIA-364-37B - TP-37B Contact Engagement and Separation Force Test Procedure for Electrical Connectors (ANSI/EIA-364-37B-98)
EIA-364-38B - TP-38B Cable Pull-Out Test Procedure for Electrical Connectors (ANSI/EIA-364-38B-99)
EIA-364-39B - TP-39B Hydrostatic Test Procedure for Electrical Connectors, Contacts and Sockets (ANSI/EIA-364-39B-99)
EIA-364-40B - TP-40B Crush Test Procedure for Electrical Connectors (ANSI/EIA-364-40B-98)
EIA-364-41C - TP-41C Cable Flexing Test Procedure for Electrical Connectors (ANSI/EIA-364-41C-99)
EIA-364-42B - TP-42B Impact Test Procedure for Electrical Connectors (ANSI/EIA-364-42B-99)
EIA-364-43A - TP-43A Cable Clamping (Bending Moment) Test Procedure for Electrical Connectors (ANSI/EIA-364-43A-83) (R90)
EIA-364-44A - TP-44A, Corona Test Procedure for Electrical Connectors (ANSI/EIA-364-44A-98)
EIA-364-45 - TP-45 Flame Test Procedure for Firewall Electrical Connectors (ANSI/EIA-364-45-91)
EIA-364-45A - TP-45A Firewall Flame Test Procedure for Electrical Connectors (ANSI/EIA-364-45-00)
EIA-364-46A - TP-46A Microsecond Discontinuity Test Procedure for Electrical Connectors, Contacts and Sockets (ANSI/EIA-364-46A-98)
EIA-364-47 - TP-47 Conductor Unwrap Test Procedure for Solderless Wrapped Electrical Contacts (ANSI/EIA-364-47-88)
EIA-364-48 - TP-48 Test Procedure for Metallic Coating Thickness Measurements of Contacts (ANSI/EIA-364-48-90)
EIA-364-50A - TP-50A Dust (Fine Sand) Test Procedure for Electrical Connectors (ANSI/EIA-364-50A-98)
EIA-364-51 - TP-51 Ice Resistance of Mated Connectors, Test Procedure for Electrical Connectors (ANSI/EIA-364-51-83) (R90)
EIA-364-52 - TP-52 Test Procedures for Solderability of Contact Terminations Used in Connectors/Sockets (ANSI/EIA-364-52-93)
EIA-364-53A - TP-53A Nitric Acid Vapor Test, Gold Finish Test Procedure for Electrical Connectors (ANSI/EIA-364-53A-97)
EIA-364-53B - TP-53B Nitric Acid Vapor Test, Gold Finish Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-53B-00)
EIA-364-54A - TP-54A Magnetic Permeability Test Procedure for Electrical Connectors, Contacts, and Sockets (ANSI/EIA-364-54A-99)
EIA-364-55 - TP-55 Current Cycling Test Procedure for Electrical Connectors (ANSI/EIA-364-55-85)
EIA-364-56A - TP-56 Resistance to Soldering Heat Test Procedure for Electrical Connectors (ANSI/EIA-364-56A-91)
EIA-364-58 - TP-58 Temperature Life with Mechanical Loading for Connectors with Removable Contacts (Static Mechanical Load at Temperature) (ANSI/EIA-364-58-87)
EIA-364-59 - TP-59 Low Temperature Test Procedure for Electrical Connectors (ANSI/EIA-364-59-88)
EIA-364-60 - TP-60 General Methods for Porosity Testing of Contact Finishes for Electrical Connectors (ANSI/EIA-364-60-88)
EIA-364-62 - TP-62 Electrical Connector Test Procedure, Terminal Strength (ANSI/EIA-364-62-89)
EIA-364-65A - TP-65A, Mixed Flowing Gas (ANSI/EIA-364-65A-97)
EIA-364-66 - TP-66 EMI Shielding Test Procedure for Electrical Connectors (ANSI/EIA-364-66-91)
EIA-364-66A - TP-66A EMI Shielding Effectiveness Test Procedure for Electrical Connectors (ANSI/EIA-364-66A-00)
EIA-364-68 - TP-68 Actuating Mechanism Test Procedure for Electrical Connectors (ANSI/EIA-364-68-90)
EIA-364-69 - TP-9 Low Level Inductance Measurement for Electrical Contacts of Electrical Connectors (ANSI/EIA-364-69-89)
EIA-364-70A - TP-70A Temperature Rise Versus Current Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-70A-98)
EIA-364-71A - TP-71A Solder Wicking (Wave Solder Technique) Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-71A-99)
EIA-364-75 - TP-75, Lightning Strike Test Procedure for Electrical Connectors (ANSI/EIA-364-75-97)
EIA-364-78 - TP-78 Cavity-to-Cavity Leakage Bonding Integrity Test Procedure for Electrical Connectors (ANSI/EIA-364-78-91)
EIA-364-79 - TP-79 Insert Bond Strength Test Procedure for Electrical Connectors (ANSI/EIA-364-79-98)
EIA-364-81 - TP-81, Combustion Characteristics of Connector Housings, Connector Assemblies and Sockets (ANSI/EIA-364-81-94)
EIA-364-82 - TP-82 Corrosivity of Plastics (Connector/Socket Housing) (ANSI/EIA-364-82-93)
EIA-364-83 - TP-83 Shell-to-Shell and Shell-to-Bulkhead Resistance Test Procedure for Electrical Connectors (ANSI/EIA-364-83-99)
EIA-364-85 - TP-85, General Test Procedure for Assessing Wear and Mechanical Damage Testing of Contact Finishes for Electrical Connectors (ANSI/EIA-364-85-96)
EIA-364-86 - TP-86, Polarizing/Coding Key Overstress Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-86-96)
EIA-364-87 - TP-87, Nanosecond-Event Detection for Electrical Connectors, Contacts and Sockets (ANSI/EIA-364-87-96)
EIA-364-88 - TP-88, Residual Magnetism for Electrical Connectors (ANSI/EIA-364-88-95)
EIA-364-89 - TP-89, Test Procedures for Electrical Connectors for Space Applications (ANSI/EIA-364-89-95)
EIA-364-90 - TP-90 Crosstalk Ratio Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnect Systems (ANSI/EIA-364-90-00)
EIA-364-91 - TP-91, Dust Test for Electrical Connectors and Sockets (ANSI/EIA-364-91-96)
EIA-364-92 - TP-92, Wire Bending Test Procedure for Insulation Displacement Contacts (IDC) for Electrical Connectors (ANSI/EIA-364-92-97)
EIA-364-93 - TP-93, Repeated Wire Connection and Disconnection Test Procedure for Insulation Displacement Contacts (IDC) for Electrical Connectors (ANSI/EIA-364-93-97)
EIA-364-94 - TP-94 Transverse Extraction Force Test Procedure for Insulation Displacement Contacts (IDC) for Electrical Connectors (ANSI/EIA-364-94-97)
EIA-364-95 - TP-95 Full Mating and Mating Stability Test Procedure for Electrical Connectors (ANSI/EIA-364-95-99)
EIA-364-97 - TP-97 Housing Panel Retention Test Procedure for Electrical Connectors (ANSI/EIA-364-97-97)
EIA-364-98 - TP-98, Housing Locking Mechanism Strength Test Procedure for Electrical Connectors (ANSI/EIA-364-98-97)
EIA-364-99 - TP-99 Gage Location and Retention Test Procedure for Electrical Connectors (ANSI/EIA-364-99-99)
EIA-364-B-1 - Insulating Material Batch Acceptance Tests (ANSI/EIA-354-B-93). This is an addendum to EIA-364-C.
EIA-364-C - Electrical Connector/Socket Test Procedures Including Environmental Classifications (ANSI/EIA-364-C-94)
EIA-369 - Midget I.F. Shields (.75-Inch, Square)
EIA-376 - Fixed Film Dielectric Capacitors in Metallic and Non-Metallic Cases for DC Application (ANSI/EIA-376-71) (R76) (R83) (R90)
EIA-376-1 - Addendum No. 1 to EIA-376 Parts List Supplement (ANSI/EIA-376-1-72) (R83) (R90)
EIA-377 - Metallized Dielectric Capacitors in Metallic and Non-Metallic Cases for Direct Current Application (ANSI/EIA-377-71) (R83) (R90)
EIA-377-1 - Addendum No. 1 to EIA-377 Parts List Supplement (ANSI/EIA-377-1-73) (R76) (R83)
EIA-380-A - Small Contact Standard for Electrical Connectors (ANSI/EIA-380-A-78)
EIA-386 - Recommended Measurement Method for Phonograph Rumble (ANSI/EIA-386-72) (R78)
EIA-393 - Core Laminations, Vertical and Horizontal Channel Frames for Transformers for Radio and TV Receivers (ANSI/EIA-393-72) (R78) (R83)
EIA-395 - Polarized Aluminum Electrolytic Capacitors for Long Life (Type 1) and for General Purpose Application (Type 2) (ANSI/EIA-395-72) (R78) (R83)
EIA-395-1 - Addendum No. 1 to EIA-395 (ANSI/EIA-395-1-75) (R78) (R81)
EIA-401 - Paper, Paper/Film, Film Dielectric Capacitors for Power Semiconductor Applications (ANSI/EIA-401-73) (R79) (R83) (R90)
EIA-402 - Liquid Rosin Fluxes (ANSI/EIA-402-73) (R79) (R86)
EIA-403-A - Precision Coaxial Connectors for CATV Application (75 Ohms) (ANSI/EIA-403-A-90)
EIA-405 - Recommended Test Method for Flutter Measurement of Instrumentation Magnetic Tape Recorder/Reproducers (ANSI/EIA-405-73) (R79)
EIA-406 - General Document for Connectors, Electric, Printed Wiring Board (IPC-C-405-A) (ANSI/EIA-406-73) (R79) (R90)
EIA-407-A - EIA/NARM Standard: Testing Procedures for Relays for Electrical and Electronic Equipment (ANSI/EIA-407-A-78) (R85)
EIA-416 - Filters, Radio Interference (ANSI/EIA-416-74) (R81)
EIA-417-A - Crystal Outlines (ANSI/EIA-417-A-91)
EIA-421-A - EIA/NARM Standard for Dry Reed Switches (ANSI/EIA-421-A-83)
EIA-429 - Industry Standard for Connectors, Electrical Flat Cable Type (IPC-FC-218B) (ANSI/EIA-429-76) (R91)
EIA-436 - EIA/NARM Standard for Dry Reed Relays for Circuit Board Mounting (ANSI/EIA-436-76) (R85)
EIA-443 - EIA/NARM Standard for Solid-State Relay Service (ANSI/EIA-443-79)
EIA-446-3 - Detail Specification: Illuminated and Non-Illuminated Pushbutton Switches, 0.750 Square Mounting, 1 and 2 Poles, .001 to 10 Amperes (ANSI/EIA-446-3-81)
EIA-446-4 - Detail Specification, Illuminated and Non-Illuminated Non-Sensitive Switches, .625 Square Mounting, 1 and 2 Poles, 1.0 Ampere (ANSI/EIA-446-4-81)
EIA-446-A - Non-Sensitive Pushbutton Switches (ANSI/EIA-446-A-81)
EIA-448 - Standard Test Methods for Electromechanical Switches (ANSI/EIA-448-78) (R83)
EIA-448 Series - Test Methods for Electromechanical Switches
EIA-448-19 - Method 19: Test Standard for Electromechanical Components, Environmental Effects of Machine Soldering Using a Vapor Phase System (ANSI/EIA-448-87)
EIA-448-1B - Standard Test Method for Electromechanical Switches (Test for Contact Bounce) (ANSI/EIA-448-1B-92)
EIA-448-2 - Test Standard for Electromechanical Components, Environmental Effects of Machine Soldering (ANSI/EIA-448-2-80) (R90)
EIA-448-20 - Method 20: Test Method for Electromechanical Components: Test Method for Lens Face Touch Temperature (ANSI/EIA-448-20-89)
EIA-448-21 - Method 21: Test Standard for Electromechanical Switches: Environmental Effects of Machine Soldering Using an Infrared System (ANSI/EIA-448-21-89)
EIA-448-22 - Resistance to Soldering Heat, Soldering Method (ANSI/EIA-448-22-90)
EIA-448-23 - Surface Mountable Switches, Qualification Test (ANSI/EIA-448-23-90)
EIA-448-24 - Test Method 24, Solid State Switch Transfer Tests
EIA-448-3A - Method 3: Standard Test Methods for Electromechanical Switches: Chromaticity (ANSI/EIA-448-3-A-90)
EIA-448-4 - Standard Test Methods for Logic (TTL) Level Endurance and Low Level Endurance (ANSI/EIA-448-4-80) (R90)
EIA-452 - Fixed Film Resistors, High Resistance/High Voltage (ANSI/EIA-452-78) (R83) (R90)
EIA-454 - Fixed Paper and Film-Paper Dielectric Capacitors with Non-PCB Impregnants for Alternating Current Applications (ANSI/EIA-454-78) (R83) (R90)
EIA-456-A - Metallized Film Dielectric Capacitors for Alternating Current Application (ANSI/EIA-456-A-89)
EIA-463-A - Fixed Aluminum Electrolytic Capacitors for Alternating Current Motor Starting, Heavy Duty (Type 1) and for Standard Duty (Type 2) (ANSI/EIA-463-A-99)
EIA-469-C - Standard Test Method for Destructive Physical Analysis of High Reliability Ceramic Monolithic Capacitors (ANSI/EIA-469-B-88)
EIA-473 - EIA/NARM Standard Definitions and Terminology for Relays for Electronic Equipment (ANSI/EIA-473-81)
EIA-477-A - Cultured Quartz (ANSI/EIA-477-A-90)
EIA-479-A - Film-Paper, Film Dielectric Capacitors for 50/60 Hz Voltage Doubler Power Supplies (ANSI/EIA-479-A-93)
EIA-480 - Toggle Switches (ANSI/EIA-480-81)
EIA-483 - Standard Method of Test for Effective Series Resistance (ESR) and Capacitance of Multilayer Ceramic Capacitors at High Frequencies (ANSI/EIA-483-81)
EIA-495-A - Film Dielectric Capacitors with Metallized Paper Electrodes for Alternating Current Applications (ANSI/EIA-495-A-89)
EIA-498 Series - Keyboard Specification
EIA-4980000-A - Generic Specification for Keyboard Switches of Certified Quality (ANSI/EIA-4980000-A-89)
EIA-498A000 - Sectional Specification for Full and Short Stroke Keyboards of Certified Quality
EIA-498AA00 - Blank Detail Specification for Keyboard Switches (ANSI/EIA-498AA00-92)
EIA-498AAAA - Detail Specification for Short Stroke Keypads (ANSI/EIA-498AAAA-92)
EIA-498B000 - Sectional Specification for Touch Stroke Switch Panels of Certified Quality (ANSI/EIA-498B000-88)
EIA-498BA00 - Blank Detail Specification for Keyboard Switches
EIA-498BAAA - Detail Specification for Capability Approval of Metal Dome Contact Touch Stroke Switch Panels (ANSI/EIA-498BAAA-88)
EIA-512 - Standard Methods for Measurement of the Equivalent Electrical Parameters of Quartz Crystal Units, 1 kHz to GHz (ANSI/EIA-512-85)
EIA-512-1 - Standard Methods for Measurement of the Equivalent Electrical Parameters of Quartz Crystal Units, 1 kHz to GHz (ANSI/EIA-512-1-90)
EIA-513 - EIA/NARM Standard: Low Profile Relays for Circuit Board Mounting (ANSI/EIA-513-86)
EIA-520 Series - Specification for Switches - Digital, Dual In-Line, Pushbutton, Rotary, Sensitive and Toggle
EIA-5200000-C - Generic Specification for Special-Use Electromechanical Switches of Certified Quality (ANSI/EIA-5200000-93)
EIA-520A000-A - Sectional Specification for Pushbutton Switches of Certified Quality (ANSI/EIA-520A000-A-92)
EIA-520AA00 - Blank Detail Specification for Special-Use Pushbutton Switches of Certified Quality (ANSI/EIA-520AA00-88)
EIA-520AAAA-A - Detail Specification for Non-Sensitive Pushbutton Switch, Single-Pole Contact
EIA-520AAAB-A - Detail Specification for Non-Sensitive Pushbutton Switch, Momentary Contact (ANSI/EIA-520AAAB-A)
EIA-520AAAC - Detail Specification for Switch, Non-Sensitive, Pushbutton 15.88 mm of Mounting Hole (ANSI/EIA-520AAAC-90)
EIA-520AAAE - Detail Specification for Switch, Pushbutton, Square, or Rectangular Mounting, Illuminated or Non-Illuminated, 3 A (ANSI/EIA-520AAAE-88)
EIA-520AAAF - Detail Specification for Pushbutton Switches, 19 mm x 29 mm, 10 Amperes (ANSI/EIA-520AAAF-88)
EIA-520C000 - Sectional Specification for Sensitive Switches of Certified Quality (ANSI/EIA-520C000-87)
EIA-520CA00-A - Blank Detail Specification for Special-Use Sensitive Switches of Certified Quality (ANSI/EIA-520CA00-A-92)
EIA-520CAAA-A - Detail Specification for Sensitive Switches, Single Break Contacts, Basic Size (ANSI/EIA-520CAAA-A-92)
EIA-520CAAB-A - Detail Specification for Sensitive Switches, Single Break Contacts, Miniature Size (ANSI/EIA-520CAAB-A-92)
EIA-520CAAC-A - Detail Specification for Sensitive Switches, Single Break Contacts, Subminiature Size 5A (ANSI/EIA-520CAAC-A-92)
EIA-520CAAD-A - Detail Specification for Sensitive Switches, Single Break Contacts, Size 7A (ANSI/EIA-520CAAD-A-92)
EIA-520D000 - Sectional Specification for Toggle, Paddle, and Rocker Switches of Certified Quality (ANSI/EIA-520D000-87)
EIA-520DA00 - Blank Detail Specification for Special-Use Toggle, Paddle, and Rocker Switches of Certified Quality (ANSI/EIA-520DA00-87)
EIA-520DAAA - Detail Specification on 1 Pole Toggle Switches (ANSI/EIA-520DAAA-90)
EIA-520DAAB - Detail Specification on 2 Pole Toggle Switches (ANSI/EIA-520DAAB-90)
EIA-520DAAC - Detail Specification on 4 Pole Toggle Switches (ANSI/EIA-520DAAC-90)
EIA-520E000 - Sectional Specification for In-Line Switches of Certified Quality (ANSI/EIA-520E000-89)
EIA-520EA00 - Blank Detail Specification for In-Line Switches (ANSI/EIA-520EA00-89)
EIA-520EAAA - Detail Specification for Surface Mountable Dual In-Line Switches of Certified Quality (ANSI/EIA-520EAAA-89)
EIA-520EAAB - Detail Specification for Machine Insertable Dual In-Line Switches of Certified Quality (ANSI/EIA-520EAAB-89)
EIA-520EAAC - Detail Specification for Dual In-Line Switches of Certified Quality (ANSI/EIA-520EAAC-90)
EIA-520EAAD - Detail Specification for Dual In-Line Package (DIP) Switches, Raised and Recessed Slide Actuated (ANSI/EIA-520EAAD-90)
EIA-520F000-A - Sectional Specification for Rotary Switches of Certified Quality (Low Current Capacity - 2 Amperes or Less) (ANSI/EIA-520F000-A-96)
EIA-520FA00 - Blank Detail Specification for Special-Use Rotary Switches of Certified Quality (ANSI/EIA-520FA00-92)
EIA-520FAAA - Detail Specification for Rotary Switches of Certified Quality (Low Current Rating) 12 Positions Maximum (ANSI/EIA-520FAAA-95)
EIA-520FAAB - Detail Specification for Rotary Switches of Certified Quality (Low Current Rating) 16 Positions Maximum (ANSI/EIA-520FAAB-95)
EIA-521 - Application Guide for Multilayer Ceramic Capacitors - Electrical
EIA-534 - Applications Guide, Soldering and Solderability Maintenance of Leaded Electronic Components (ANSI/EIA-534-88)
EIA-535 Series - Fixed Tantalum Capacitors
EIA-535AAAA - Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode with Wire Lead Terminals (ANSI/EIA-535AAAA-87)
EIA-535AAAB - Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode with Wire Lead Terminals (ANSI/EIA-535AAAB-87)
EIA-535AAAC - Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode with Radial Leads (ANSI/EIA-535AAAC-87)
EIA-535AAAD - Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode with Wire Lead Terminals (ANSI/EIA-535AAAD-87)
EIA-535AAAE - Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode with Wire Lead Terminals (ANSI/EIA-535AAAE-87)
EIA-535AAAF - Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode with Wire Lead Terminals (ANSI/EIA-535AAAF-87)
EIA-535ABAA - Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode (ANSI/EIA-535ABAA-87)
EIA-535ABAB - Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode (ANSI/EIA-535ABAB-87)
EIA-535ABAC - Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode (ANSI/EIA-535ABAC-87)
EIA-535ABAD - Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode (ANSI/EIA-535ABAD-87)
EIA-535ABAE - Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode (ANSI/EIA-535ABAE-87)
EIA-535ACAA - Fixed Tantalum Capacitors with Non-Solid Electrolyte and Foil Anode (ANSI/EIA-535ACAA-87)
EIA-535ACAB - Fixed Tantalum Capacitors with Non-Solid Electrolyte and Foil Anode (ANSI/EIA-535ACAB-87)
EIA-535ACAC - Fixed Tantalum Capacitors with Non-Solid Electrolyte and Foil Anode (ANSI/EIA-535ACAC-87)
EIA-535ACAD - Fixed Tantalum Capacitors with Non-Solid Electrolyte and Foil Anode (ANSI/EIA-535ACAD-87)
EIA-535BAAA - Fixed Tantalum Chip Capacitor, Style 1 Protected Standard Capacitance Range (ANSI/EIA-535BAAA-87)
EIA-535BAAB - Fixed Tantalum Chip Capacitor, Style 1 Protected Extended Capacitance Range (ANSI/EIA-535BAAB-87)
EIA-535BAAC-A - Fixed Tantalum Chip Capacitor Style 1 Protected (molded) (ANSI/EIA-535BAAC-A-98)
EIA-535BAAD - Fixed Tantalum Chip Capacitor, Style 1 Protected Extended Capacitance Range (ANSI/EIA-535BAAD-90)
EIA-540 Series - Sockets - Detail Specifications for Chip Carriers and Electronic Equipment
EIA-5400000-A - Generic Specification for Sockets for Use in Electronic Equipment (ANSI/EIA-5400000-A-96)
EIA-5400BAA - Detail Specification for Decoupling Capacitor Dual In-Line Package Sockets for Use in Electronic Equipment (ANSI/EIA-5400BAA-94) (R97)
EIA-540A000-A - Sectional Specification for Sockets for Chip Carriers for Use in Electronic Equipment (ANSI/EIA-540A000-A-90) (R97)
EIA-540AA00 - Blank Detail Specification for Chip Carrier Sockets for Leadless Type A, B, or D Chip Carriers for Use in Electronic Equipment (ANSI/EIA-540AA00-91)
EIA-540AAAA - Detail Specification for Chip Carrier Sockets for Leadless Type A [1.27 mm (0.050 in)] Spacing Chip Carriers for Use in Electronic Equipment (ANSI/EIA-540AAAA-90)
EIA-540AB00 - Blank Detail Specification for Chip Carrier Sockets for Plastic Quad Flat Packages for Use in Electronic Equipment (ANSI/EIA-540AB00-91)
EIA-540ABAA - Detail Specification for Chip Carrier Sockets for Plastic Quad Flat Pack 0.635 mm (0.025 in) Lead Spacing (Gullwing) (ANSI/EIA-540ABAA-91)
EIA-540AC00 - Blank Detail Specification for Chip Carrier Sockets for Plastic Chip Carrier (PCC) Packages with "J" Type Leads for Use in Electronic Equipment (ANSI/EIA-540AC00-91)
EIA-540ACAA - Detail Specification for Plastic Chip Carrier (PCC) Family 1.27 mm (0.050 in) Lead Spacing (ANSI/EIA-540ACAA-91)
EIA-540AD00 - Blank Detail Specification for Adaptor Carrier Quad Flat Pack to Pin Grid Array Sockets for Use in Electronic Equipment (ANSI/EIA-540AD00-91)
EIA-540ADAA - Detail Specification for Adaptor Carrier Quad Flatpack to Pin Grid Array Sockets for Use in Electronic Equipment (ANSI/EIA-540ADAA-92) (R98)
EIA-540B000 - Sectional Specification: Sockets for Pin Grid Array Devices with 2.54 mm x 2.54 mm (0.1in x 0.1in) Spacing for Use in Electronic Equipment (ANSI/EIA-540B000-89)
EIA-540B0AA - Detail Specification for Production Ball Grid Array (BGA) Sockets with 1.27 mm (0.050 in) Spacing for Use in Electronic Equipment (ANSI/EIA-540B0AA-97)
EIA-540B0AE - Detail Specification for Production Land Grid Array (LGA) Socket for Use in Electronic Equipment (ANSI/EIA-540B0AE-00)
EIA-540BA00 - Blank Detail Specification: Sockets for Pin Grid Array Devices with 2.54 mm x 2.54 mm (0.1 in x 0.1 in) Spacing for Use in Electronic Equipment (ANSI/EIA-540BA00-90)
EIA-540BAAA-A - Detail Specification for Mechanically Actuated (Zero and Low Insertion Force) Sockets for Pin Grid Array Devices with 2.54 mm x 2.54 mm (0.1 in x 0.1 in) Spacing for Use in Electronic Equipment (ANSI/EIA-540BAAA-A-96)
EIA-540BAAB - Detail Specification for Non-Mechanically Actuated Sockets for Pin Grid Array Devices with 2.54 mm x 2.54 mm (0.1 in x 0.1 in) Spacing for Use in Electronic Equipment (ANSI/EIA-540BAAB-90)
EIA-540BAAC - Detail Specification for Non-Mechanically Actuated Flexible Carrier Sockets for Pin Grid Array Devices for Use in Electronic Equipment (ANSI/EIA-540BAAC-91)
EIA-540C000 - Sectional Specification, Sockets for Relays for use in Electronic Equipment (ANSI/EIA-540C000-88) (R96)
EIA-540CA00 - Blank Detail Specification on Relay Sockets (ANSI/EIA-540CA00-1989) (R96)
EIA-540CAAA - Detail Specification on Relay Socket - 10 A for Balanced Armature Relay (ANSI/EIA-540CAAA-89) (R96)
EIA-540CAAB - Detail Specification on Relay Sockets - 5 A for Balanced Armature Relay (ANSI/EIA-540CAAB-1989) (R96)
EIA-540CAAC-A - Detail Specification for 2 Pole, 10 A Relay Sockets
EIA-540CAAD-A - Detail Specification for 2 Pole, 5 A Relay Sockets (ANSI/EIA-540CAAD-A-99)
EIA-540CAAE-A - Detail Specification for 3 Pole, 10 A Relay Sockets (ANSI/EIA-540CAAE-99)
EIA-540D000-A - Sectional Specification for In-Line Package Sockets for Use in Electronic Equipment (ANSI/EIA-540D000-A-91)
EIA-540DA00 - Blank Detail Specification for Dual In-Line Sockets for Use in Electronic Equipment (ANSI/EIA-540DA00-91)
EIA-540DAAA-A - Detail Specification for Dual-In-Line 2 Piece Contact Socket for Use in Electronic Equipment (ANSI/EIA-540DOAA-A-91)
EIA-540DAAB - Detail Specification for Flexible Carrier 2 Piece Dual In-Line Sockets for Use in Electronic Equipment (ANSI/EIA-540DAAB-91)
EIA-540DB00 - Blank Detail Specification for Decoupling Capacitor Dual In-Line Package Sockets (ANSI/EIA-540D00-92) (R99)
EIA-540DBAA - Detail Specification for Decoupling Capacitor Dual In-Line Package Sockets for Use in Electronic Equipment (ANSI/EIA-540DBAA-94) (R99)
EIA-540E000 - Sectional Specification for Round-Style Sockets for Use in Electronic Equipment (ANSI/EIA-540E000-92) (R99)
EIA-540EA00 - Blank Detail Specification for Round Style Sockets (ANSI/EIA-540EA00-97)
EIA-540EAAA - Detail Specification for Round Style Sockets (ANSI/EIA-540EAAA-97)
EIA-540F000 - Sectional Specification for Multi-Package Module Sockets for Use in Electronic Equipment (ANSI/EIA-540F000-91)
EIA-540FA00 - Blank Detail Specification for Multi-Package Module Sockets for Use in Electronic Equipment (ANSI/EIA-540FA00-92)
EIA-540FAAA - Detail Specification for Multi-Package 100 Mil Pitch, Vertical Mounting Format Module Sockets for Use in Electronic Equipment (ANSI/EIA-540FAAA-92) (R98)
EIA-540FAAB - Detail Specification for Multi-Package 100 Mil Pitch, Angled Mounting Format Module Sockets for Use in Electronic Equipment (ANSI/EIA-540FAAB-92) (R98)
EIA-540FAAC - Detail Specification for Multi-Package 50 Mil Pitch, Vertical Mounting Format Module Sockets for Use in Electronic Equipment (ANSI/EIA-540FAAC-92)
EIA-540FAAD - Detail Specification for Multi-Package 50 Mil Pitch, Angled Mounting Format Module Sockets for Use in Electronic Equipment (ANSI/EIA-540FAAD-92)
EIA-540G000 - Sectional Specification for Burn-In Sockets for Use in Electronic Equipment (ANSI/EIA-540G000-93)
EIA-540GA00 - Blank Detail Specification for Burn-In Sockets for Chip Carrier Packages with Molded Carrier Rings for Use in Electronic Equipment (ANSI/EIA-540GA00-93)
EIA-540GAAA - Detail Specification for Burn-In Sockets for Chip Carrier Packages with Molded Carrier Rings for Use in Electronic Equipment (ANSI/EIA-540GAAA-93)
EIA-540H000 - Sectional Specification for Burn-In Sockets Used with Ball Grid Array Devices for Use in Electronic Equipment (ANSI/TIA/EIA-540H000-97)
EIA-540HA00 - Blank Detail Specification for Burn-In Sockets Used with Ball Grid Array Devices for Use in Electronic Equipment (ANSI/EIA-540HA00-00)
EIA-540HAAA - Detail Specification for Burn-In Sockets Used with Ball Grid Array Devices for Use in Electronic Equipment (ANSI/EIA-540HAAA-00)
EIA-540J000 - Sectional Specification for Battery Holders for Use in Electronic Equipment (ANSI/EIA-540J000-00)
EIA-540J0AA - Detail Specification for Cylindrical Battery Holders, Standard Profile, for Use in Electronic Equipment (ANSI/EIA-540J0AA-00)
EIA-545 - Electromechanical Switch Test Method for Electrostatic Discharge (ESD) (ANSI/EIA-545-89)
EIA-550 - 75 Ohm Type FD Connector Interfaces, Rating, and Characteristics (ANSI/EIA-550-89)
EIA-575 - Resistors, Rectangular, Surface Mount, General Purpose (ANSI/EIA-575-90)
EIA-576 - Resistors, Rectangular, Surface Mount, Precision (ANSI/EIA-576-90)
EIA-580A000 - Sectional Specification for Fixed Chip Capacitors with Metallized Electrodes and Polyethylene-Terephthalate Dielectric for Use in Electronic Equipment (ANSI/EIA-580A000-91)
EIA-580A0AC - Detail Specification for Fixed Metallized Polyethylene Terephthalate Film Dielectric DC Capacitors Axial Leaded (ANSI/EIA-580A0AC-98)
EIA-580AA00 - Blank Detail Specification for Fixed Metallized Polyethylene-Terephthalate Film Dielectric Chip Capacitors for Direct Current Encapsulated (ANSI/EIA-580AA00-91)
EIA-580BA00 - Blank Detail Specification: Fixed Metallized Electrode Film Dielectric AC Capacitors (ANSI/EIA-580BA00-97)
EIA-595 - Visual and Mechanical Inspection Multilayer Ceramic Chip Capacitors
EIA-616 - 2 Millimeter, Two-Part Connectors for Use with Printed Boards and Backplanes (ANSI/EIA-616-96)
EIA-622 - Glossary of Electrical Connector Related Terms (ANSI/EIA-622-95)
EIA-638 - Surface Mount Solderability Test (ANSI-EIA-638-95)
EIA-674 - Specification for Small Form Factor 45.7 mm (1.8 in) Disk Drives (ANSI/EIA-674-96)
EIA-675 - Specification for Small Form Factor 33.0 (1.3 in) Disk Drives (ANSI/EIA-675-96)
EIA-676 - Specification for Small Form Factor 45.7 mm (1.8 in) Disk Drives, 15 mm (0.59 in) High (ANSI/EIA-676-96)
EIA-677 - Specification for Small Form Factor Power Connector Pin Dimensions (ANSI/EIA-677-97)
EIA-699 - Test Method for the Visual Inspection of Quartz Crystal Resonator Blanks (ANSI/EIA-699-97)
EIA-7000000-A - Generic Specification for Electronic and Electrical Connectors of Certified Quality (for Frequencies Essentially Below 3 MHz) (ANSI/EIA-7000000-A-96)
EIA-700A0AA - Detail Specification for 1.27 mm Pitch, Ribbon Contact, Trapezoidal Shaped, Shielded I/O Connector (ANSI/EIA-700A0AA-95)
EIA-700A0AB - Detail Specification for 1.27 mm Pitch, 68 Circuit Memory Card Interconnect System (ANSI/EIA-700A0AB-95)
EIA-700A0AC - Detail Specification for 1.00 mm Pitch, 88 Circuit Dram Memory Card Interconnect System (ANSI/EIA-700A0AC-96)
EIA-700A0AE - Detail Specification for Trapezoidal Connectors with Nonremovable Ribbon Cable Contacts on 1.27 mm Pitch Double Row Use with Single Connector Attachments (SCA2) (ANSI/EIA-700A0AE-00)
EIA-700AAAB - Detail Specification for 1.0 mm, Two-Part Connectors for Use with Parallel Printed Boards (ANSI/EIA-700AAAB-96)
EIA-700B000 - Sectional Specification for Rectangular/Trapezoidal Connectors of Certified Quality (ANSI/EIA-700B000-99)
EIA-700BA00 - Blank Detail Specification for Rectangular/Trapezoidal Connectors of Certified Quality (ANSI/EIA-700BA00-98)
EIA-700BAAD - Detail Specification for Shielded Rectangular Connectors for Universal Serial Bus Plus Power Connectors Series "A" (ANSI/EIA-700BAAD-00)
EIA-700BAAE - Detail Specification for Shielded Rectangular Connectors for Universal Serial Bus Plus Power Connectors Series "B" (ANSI/EIA-700BAAE-00)
EIA-700C000 - Sectional Specification for Circular Multicontact Connectors of Assessed Quality (for frequencies essentially below 3 MHz) (ANSI/EIA-700C000-96)
EIA-700D000 - Sectional Specification for Discrete Contacts of Certified Quality (for Use in dc/low Frequency Analog Applications and in Digital Applications Employing High Speed Data Rates (ANSI/EIA-700D000-97)
EIA-710 - Requirements Guide for Space Grade Electrical Connectors (ANSI/EIA-710-97)
EIA-720 - EIA Specification for Small Form Factor 63.5 mm (2.5 in) Disk Drives (ANSI/EIA-720-97)
EIA-740 - Specification for Small Form Factor 88.9 mm (3.5 in) Disk Drives
EIA-743 - Usable Screen Dimensions for Monochrome Display Tubes (ANSI/EIA-743-99)
EIA-773 - Check List for Document Development and Revision (ANSI/EIA-773-00)
EIA-800 - Integrated Passive Device (IPD) Chipscale Package Design Guidelines
EIA-809 - Solid Tantalum Capacitor Application Guideline
EIA-815 - Miniature Aluminum Electrolytic Capacitor (Leaded) Qualification Specification
EIA-850 - ECA Component Registration - Integrated Passive Devices Product Registrations
J-STD-001B - Requirements for Soldered Electrical and Electronic Assemblies
J-STD-002A - Solderability Tests for Component Leads, Terminations, Lugs, Terminals, and Wires
J-STD-003 - Solderability Tests for Printed Boards
J-STD-004 - Requirements for Soldering Fluxes
J-STD-005 - Requirements for Soldering Paste
J-STD-006 - Requirements for Electronic Grade Solder Alloys and Fluxed and Non-fluxed Solid Solders for Electronic Soldering Applications
J-STD-012 - Implementation of Flip Chip and Chip Scale Technology
J-STD-013 - Implementation of Ball Grid Array and Other High Density Technology
J-STD-026 - Semiconductor Design Standard for Flip-Chip Applications
J-STD-028 - Performance Standard for Flip Chip /Chip Scale Bumps
PDP-100 - Registered and Standard Mechanical Outlines for Electronic Parts
PQC31 - Sectional Specification "Fixed Tantalum Chip Capacitors with Solid Electrolyte"
PQC32 - Blank Detail Specification "Fixed Tantalum Chip Capacitors, Assessment Level E"
PQC41/US0001-1 - Detail Specification "Dual-In-Line Package Switches, Raised and Recessed Rocker Actuated"
PQC41/US0002-1 - Detail Specification "Dual-In-Line Package Switches, Raised and Recessed Slide Actuated"
PQC43/US0001 - Detail Specification "Fixed Capacitors of Ceramic Dielectric, Class 1B, Molded Case Multilayer Ceramic, Axial Lead"
PQC43/US0002 - Detail Specification "Fixed Capacitors of Ceramic Dielectric, Class 1B, Molded Case Multilayer Ceramic, Radial Lead"
PQC43/US0003 - Detail Specification "Fixed Capacitors of Ceramic Dielectric, Class 1B, Molded Case Multilayer Ceramic, Radial Lead"
PQC43/US0004 - Detail Specification "Fixed Capacitors of Ceramic Dielectric, Class 1B, Molded Case Multilayer Ceramic, Axial Lead"
PQC45/US0001 - Detail Specification "Fixed Capacitors of Ceramic Dielectric, Class 2 x 1, Molded Case Multilayer Ceramic, Axial Leads"
PQC45/US0002 - Detail Specification "Fixed Capacitors of Ceramic Dielectric, Class 2 x 1, Molded Case Multilayer Ceramic, Radial Leads"
PQC45/US0003 - Detail Specification "Fixed Capacitors of Ceramic Dielectric, Class 2 x 1, Molded Case Multilayer Ceramic, Axial Leads"
PQC45/US0004 - Detail Specification "Fixed Capacitors of Ceramic Dielectric, Class 2 x 1, Molded Case Multilayer Ceramic, Radial Leads"
PQC71 - Generic Specification "Radio Frequency Cables of Assessed Quality (US)"
PQC72 - Sectional Specification "Radio Frequency Cables, Flexible, for Operation at a Maximum Center Conductor Temperature of 85??C (US)"
PQC73 - Blank Detail Specification "Flexible Radio Frequency Cables for Operation at a Maximum Center Conductor Temperature of 85??C, Assessment Level H (US)"
PQC73/US0001 - Detail Specification "Radio Frequency Cables at a Maximum Center Conductor Temperature of 85??C, Assessment Level H (US)"
PQC74 - Blank Detail Specification "Flexible Radio Frequency Cable for Operation at a Maximum Center Conductor Temperature of 5??C, Assessment Level U (US)"
PQC74/US0001 - Detail Specification "Radio Frequency Cables for Operation at a Maximum Center Conductor Temperature of 85??C, Assessment Level U (US)" Commonly described as ETHERNET (a trademark of Xerox Corporation) Trunk Cable.
QC210101/US0001 - Fiber Optic Connectors, Type F-SMA
QC300201/US0001 - Detail Specification "Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode" Typical construction: Wire lead terminals, hermetically sealed, axial lead, polarized, insulated
QC300201/US0002 - Detail Specification "Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode with Wire Lead Terminals"
QC300201/US0003 - Detail Specification "Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode with Radial Leads"
QC300201/US0004 - Detail Specification "Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode with Wire Lead Terminals"
QC300201/US0004-1 - Amendment No. 1 - No Charge
QC300201/US0005 - Detail Specification "Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode" Typical construction: Rectangular, nonhermetically sealed, plastic encapsulated, polarized, insulated, radial lead.
QC300201/US0005-1 - Amendment No. 1 - No Charge
QC300201/US0006 - Detail Specification "Fixed Tantalum Capacitors with Solid Electrolyte and Porous Anode" Typical construction: Rectangular, subminiature, nonhermetically sealed, plastic encapsulated, polarized, insulated, radial lead.
QC300201/US0006-1 - Amendment No. 1 - No Charge
QC300202/US0001 - Detail Specification "Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode" Typical construction: Tantalum case, axial lead, hermetically sealed, polarized, insulated.
QC300202/US0002 - Detail Specification "Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode" Typical construction: Silver plated copper alloy case, axial lead, elastomeric seal, polarized, nickel positive, copper negative leads.
QC300202/US0003 - Detail Specification "Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode" Typical construction: Silver case, axial lead, hermetically sealed, polarized, insulated.
QC300202/US0004 - Detail Specification "Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode" Typical construction: Silver case, axial lead, polarized, nickel positive, copper negative lead, case insulated, elastomer seal.
QC300202/US0005 - Detail Specification "Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode" Typical construction: Silver case, axial lead, polarized, nickel positive, copper negative lead, insulated, elastomeric seal.
QC300203/US0001 - Detail Specification "Fixed Tantalum Capacitors with Non-Solid Electrolyte and Foil Electrode" Typical construction: Hermetically sealed, axial lead, polar and bipolar plain foil.
QC300203/US0002 - Detail Specification "Fixed Tantalum Capacitors with Non-Solid Electrolyte and Foil Electrode" Typical construction: Hermetically sealed, axial lead, polar and bipolar etched and hi-etched foil.
QC300203/US0003 - Detail Specification "Fixed Tantalum Capacitors with Non-Solid Electrolyte and Foil Electrode" Typical construction: Non-hermetically sealed, axial lead, polar and bipolar plain foil.
QC300203/US0004 - Detail Specification "Fixed Tantalum Capacitors with Non-Solid Electrolyte and Foil Electrode" Typical construction: Non-hermetically sealed, axial lead, polar and bipolar etched and hi-etched foil.
QC300301/US0001 - Detail Specification "Aluminum Electrolyte Capacitors with Non-Solid Electrolyte, SE Type"
QC300301/US0002 - Detail Specification "Aluminum Electrolyte Capacitors with Non-Solid Electrolyte, LY Type"
QC300301/US0003 - Detail Specification "Fixed Aluminum Electrolyte Capacitors with Non-Solid Electrolyte--SK Type"
QC300302 - Blank Detail Specification "Aluminum Electrolyte Capacitors with Solid Electrolyte. Assessment Level E"
QC300601/US0001 - Detail Specification "Fixed Capacitors, Multilayer Ceramic Dielectric, Class 1B, Conformal Insulated Coating, Axial Leads"
QC300601/US0002 - Detail Specification "Fixed Capacitors, Multilayer Ceramic Dielectric, Class 1B, Conformal Insulated Coating, Radial Leads"
QC300601/US0003 - Detail Specification "Fixed Capacitors, Ceramic Dielectric, Class 1, Disk Type, Single Form, Radial Terminations"
QC300701/US0001 - Detail Specification "Fixed Capacitors, Multilayer Ceramic Dielectric, Class 2E4, Conformal Insulated Coating, Axial Leads"
QC300701/US0002 - Detail Specification "Fixed Capacitors, Multilayer Ceramic Dielectric, Class 2R1, Conformal Insulated Coating, Radial Leads"
QC300701/US0003 - Detail Specification "Fixed Capacitors, Multilayer Ceramic Dielectric, Class 2R1, Conformal Insulated Coating, Axial Leads"
QC300701/US0004 - Detail Specification "Fixed Capacitors, Multilayer Ceramic Dielectric, Class 2E4, Conformal Insulated Coating, Radial Leads"
QC300701/US0005 - Detail Specification "Fixed Capacitors, Ceramic Dielectric, Class 2, Disk Type, Single Form, Radial Terminations"
QC300801/US0001A - Detail Specification "Fixed Tantalum Chip Capacitor, Style 1 Protected??Standard Capacitance Range, Polar, Nonhermetically Sealed"
QC300801/US0002 - Detail Specification "Fixed Tantalum Chip Capacitor, Style 1 Protected??Extended Capacitance Range, Polar, Nonhermetically Sealed"
QC300801/US0002-1 - Amendment No. 1 - No Charge
QC400101/US0001 - Detail Specification "Fixed Low Power Non-Wirewound Resistors of Assessed Quality"
QC400101/US0002 - Detail Specification "Fixed Low Power Non-Wirewound Resistors, Insulated, Standard Film"
QC400101/US0003 - Detail Specification "Fixed Low Power Non-Wirewound Resistors, Insulated, Carbon Film"
QC400201/US0001 - Detail Specification "Fixed Power Resistors with Axial Leads, Wirewound, with Vitreous Enamel Coating, Insulated, Stability Class 5%"
QC400201/US0002 - Detail Specification "Fixed Power Wirewound Resistors, Insulated, Stability Class 0.5%"
QC400201/US0003 - Detail Specification "Fixed Power Wirewound Resistors, Insulated, Stability Class 5%"
QC400201/US0004 - Detail Specification "Fixed Power Wirewound Resistors, Insulated Heat Sink Resistors with Rigid Termination"
QC400401/US0001 - Detail Specification "Fixed Resistor Networks with Individually Measurable Resistors all of Equal Value and Equal Dissipation, Single-In-Line with all Resistors Connected" Typical construction: Thick film circuit, N = 4 to 12, Stability class 1%
QC400401/US0002 - Detail Specification "Fixed Resistor Networks with Individually Measurable Resistors all of Equal Value and Equal Dissipation, Single-In-Line with Isolated Resistors" Typical construction: Thick film circuit, N = 4 to 12, Stability class 1%
QC400401/US0003 - Detail Specification "Fixed Resistor Networks with Individually Measurable Resistors all of Equal Value and Equal Dissipation, Dual-In-Line with all Resistors Connected" Typical construction: Thick film circuit, N = 14 or 16, Stability class 1%
QC400401/US0004 - Detail Specification "Fixed Resistor Networks with Individually Measurable Resistors all of Equal Value and Equal Dissipation, Dual-In-Line with Isolated Resistors" Typical construction: Thick film Circuit, N = 14 or 16, Stability class 1%