TIA Standards published in April 1999

EIA-364-100 - TP-100 Marking Permanence Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-100-99)
EIA-364-104 - TP-104 Flammability Test Procedure for Electrical Connectors (ANSI/EIA-364-104-99)
EIA-364-105 - TP-105 Altitude - Low Temperature Test Procedure for Electrical Connectors (ANSI/EIA-364-105-99)
EIA-364-11A - TP-11A Resistance to Solvents Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-11A-99)
EIA-364-14B - TP-14B Ozone Exposure Test Procedure for Electrical Connectors (ANSI/EIA-364-14B-99)
EIA-364-20B - TP-20B Withstanding Voltage Test Procedure for Electrical Connectors, Sockets and Coaxial Contacts (ANSI/EIA-364-20B-99
EIA-364-26B - TP-26B Salt Spray Test Procedure for Electrical Connectors, Contacts and Sockets (ANSI/EIA-364-26B-99))
EIA-364-42B - TP-42B Impact Test Procedure for Electrical Connectors (ANSI/EIA-364-42B-99)
EIA-364-71A - TP-71A Solder Wicking (Wave Solder Technique) Test Procedure for Electrical Connectors and Sockets (ANSI/EIA-364-71A-99)
EIA-364-95 - TP-95 Full Mating and Mating Stability Test Procedure for Electrical Connectors (ANSI/EIA-364-95-99)
EIA-463-A - Fixed Aluminum Electrolytic Capacitors for Alternating Current Motor Starting, Heavy Duty (Type 1) and for Standard Duty (Type 2) (ANSI/EIA-463-A-99)
EIA-709.1-A - Control Network Protocol Specification (ANSI/EIA-709.1-A-99)
JEP115 - Power MOSFET Electrical Dose Rate Test Method
JEP65 - Test Procedures for Verification of Maximum Ratings of Power Transistors
JEP69-B - Preferred Lead Configuration for Field-Effect Transistors
JESD10 - Low Frequency Power Transistors
JESD14 - Semiconductor Power Control Modules
JESD24-1 - Addendum No. 1 to JESD24 - Method for Measurement of Power Device Turn-Off Switching Loss
JESD24-10 - Addendum No. 10 to JESD24 - Test Method for Measurement of Reverse Recovery Time trr for Power MOSFET Drain-Sources Diodes
JESD24-2 - Addendum No. 2 to JESD24 - Gate Charge Test Method
JESD24-3 - Addendum No. 3 to JESD24 - Thermal Impedance Measurements for Vertical Power MOSFETs (Delta Source-Drain Voltage Method)
JESD24-4 - Addendum No. 4 to JESD24 - Thermal Impedance Measurements for Bipolar Transistors (Delta Base-Emitter Voltage Method)
JESD24-5 - Addendum No. 5 to JESD24 - Single Pulse Unclamped Inductive Switching (UIS) Avalanche Test Method
JESD24-6 - Addendum No. 6 to JESD24 - Thermal Impedance Measurements for Insulated Gate Bipolar Transistors
JESD24-7 - Addendum No. 7 to JESD24 - Commutating Diode Safe Operating Area Test Procedure for Measuring dv/dt During Reverse Recovery of Power Transistors
JESD24-8 - Addendum No. 8 to JESD24 - Method for Repetitive Inductive Load Avalanche Switching
JESD24-9 - Addendum No. 9 to JESD24 - Short Circuit Withstand Time Test Method
JESD25 - Measurement of Small-Signal Transistor Scattering Parameters (Reaffirmed: April, 1999)
JESD4 - Definition of External Clearance and Creepage Distances of Discrete Semiconductor Packages for Thyristors and Rectifier Diodes
JESD6 - Measurement of Small Values of Transistor Capacitance (Reaffirmed April 1999)
J-STD-020-A - Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices
J-STD-026 - Semiconductor Design Standard for Flip-Chip Applications
J-STD-028 - Performance Standard for Flip Chip /Chip Scale Bumps
TIA/EIA/IS-707-A - Data Service Options for Wideband Spread Spectrum Systems (1999)
TIA/EIA/IS-707-A-1 - Data Service Options for Wideband Spread Spectrum Systems, Addendum 1 (1999)
TIA/EIA-102.BABC - APCO Project 25 - Vocoder Reference Test (ANSI/TIA/EIA 102.BABC-1999)
TIA/EIA-455-124 - FOTP-124 - Polarization-Mode Dispersion Measurement for Single-Mode Optical Fibers by Interferometry Method (superceded by TIA-455-124-A)
TIA/EIA-634-B - MSC-BS Interface for Public Wireless Communications Systems (withdrawn January, 2004)
TIA/EIA-758 - Customer-Owned Outside Plant Telecommunications Cabling Standard (ANSI/TIA/EIA-758-99) (superceded by TIA-758-A)
TIA/EIA-758-1 - Customer-Owned Outside Plant Telecommunications Cabling Standard, Addendum 1 (ANSI/TIA/EIA-758-1-99) (superceded by TIA-758-A)
TIA-455-124 - FOTP-124 - Polarization-Mode Dispersion Measurement for Single-Mode Optical Fibers by Interferometry Method (superceded by TIA-455-124-A)
TIA-634-B - MSC-BS Interface for Public Wireless Communications Systems (withdrawn January, 2004)
TIA-658-1 - Data Services Interworking Function Interface for Wideband Spread Spectrum Systems - Addendum 1 (1999) (r2002)
TSB-102.BAAB-A-1 - APCO Project 25 - FDMA Common Air Interface Conformance Test - Addendum 1 (1999) (r2003)
TSB-58-A - Administration of Parameter Value Assignments for TIA/EIA Wideband Spread Spectrum Standards (superceded by TSB-58-B)
TSB-69.1-2 - Enhanced Digital Access Communications System (EDACS) Land Mobile Radio System Packet Data Specification (1999) (r2003)